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Mühendislik ve Mimarlık Fakültesi / Faculty of Engineering and Architecture
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Elektrik-Elektronik Mühendisliği Bölümü
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Deep levels in n-type 4H-silicon carbide epitaxial layers investigated by deep-level transient spectroscopy and isochronal annealing studies
Mohammad, A. Mannan
;
Nguyen, Khai V.
;
Pak, Rahmi O.
;
Oner, Cihan
;
Mandal, Krishna C.
(
IEEE
,
2016
)
Investigation of thermally evaporated high resistive B-doped amorphous selenium alloy films and metal contact studies
Oner, Cihan
;
Nguyen, Khai V.
;
Pak, Rahmi O.
;
Mohammad, A. Mannan
;
Mandal, Krishna C.
(
SPIE
,
2015
)
High-barrier Schottky contact on n-type 4H-SiC epitaxial layer and studies of defect levels by deep level transient spectroscopy (DLTS)
Nguyen, Khai V.
;
Pak, Rahmi O.
;
Oner, Cihan
;
Mohammad, A. Mannan
;
Mandal, Krishna C.
(
SPIE
,
2015
)
Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements
Pak, Rahmi O.
;
Nguyen, Khai V.
;
Oner, Cihan
;
Mohammad, A. Mannan
;
Mandal, Krishna C.
(
SPIE
,
2015
)
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Mandal, Krishna C. (4)
Mohammad, A. Mannan (4)
Nguyen, Khai V. (4)
Oner, Cihan (4)
Pak, Rahmi O. (4)
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SiC (2)
Amorphous Selenium Alloys (1)
Annealing (1)
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DLTS (1)
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Date Issued
2016 (1)
2015 (3)