Mohammad, A. Mannan; Nguyen, Khai V.; Pak, Rahmi O.; Oner, Cihan; Mandal, Krishna C.
(IEEE, 2016)
Deep levels were investigated by the capacitance mode deep-level transient spectroscopy (C-DLTS) on 4H-SiC Schottky barrier diodes fabricated on 50 μm-thick n-type 4HSiC epitaxial layers. C-DLTS scans from 80 K to 800 K ...