Oner, Cihan; Chowdhury, Towhid A.; Santi, Enrico; Mandal, Krishna C.
(IEEE, 2017)
High resolution 20 μm n-type 4H-SiC epitaxial layer Schottky barrier radiation detectors were fabricated by depositing nickel (Ni) contacts using DC sputtering for both front- and backside. Current-Voltage (I-V) measurements ...